M. Kot, MSc

Faculteit Science and Engineering

Telefoon:

050 36 38750

E-mail:

m.kot rug.nl

ORCID Research Portal

Publicaties

PbS Quantum Dots Ink with Months-Long Shelf-Lifetime Enabling Scalable and Efficient Short-Wavelength Infrared Photodetectors

Wang, H., Pinna, J., Romero, D. G., Di Mario, L., Koushki, R. M., Kot, M., Portale, G. & Loi, M. A., 9-mei-2024, In: Advanced materials. 36, 19, 11 blz., 2311526.

Onderzoeksoutput › › peer review

Visualizing Thermally Activated Conical Intersections Governing Non-Radiative Triplet Decay in a Ni(II) Porphyrin-Nanographene Conjugate with Variable Temperature Transient Absorption Spectroscopy

Garcia-Orrit, S., Vega-Mayoral, V., Chen, Q., Serra, G., Guizzardi, M., Romano, V., Dal Conte, S., Cerullo, G., Di Mario, L., Kot, M., Loi, M. A., Narita, A., Müllen, K., Tommasini, M. & Cabanillas-González, J., 7-okt.-2024, In: JOURNAL OF PHYSICAL CHEMISTRY LETTERS. 15, 41, blz. 10366-10374 9 blz.

Onderzoeksoutput › › peer review

Parallax Method for a Single-Cell Diffraction Based Measurement of Misregistration

Kot, M. (Uitvinder) & Lamhot, Y. (Uitvinder), 17-aug.-2023, Octrooi Nr. US20230259041, 9-feb.-2023, Prioriteitsdatum 17-feb.-2022

Onderzoeksoutput

Parallax method for diffraction-based single-cell overlay and film thickness measurement

Kot, M. & Lamhot, Y., 27-apr.-2023, Metrology, Inspection, and Process Control XXXVII: Proceedings. Robinson, J. C. & Sendelbach, M. J. (uitgave). 3A uitgave Society of Photo-Optical Instrumentation Engineers (SPIE), (Proceedings of the Society of Photo-optical Instrumentation Engineers; vol. 12496).

Onderzoeksoutput ›

Dissipative and Hall Viscosity of a Disordered 2D Electron Gas

Burmistrov, I. S., Goldstein, M., Kot, M., Kurilovich, V. D. & Kurilovich, P. D., 9-jul.-2019, In: Physical Review Letters. 123, 2, 7 blz., 026804.

Onderzoeksoutput › › peer review

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