<div class="rug-mask js--requires-cookie-consent-trigger"><div class="rug-warning--overlay rug-hidden rug-theme--content"><span class="rug-icon rug-icon--close rug-absolute rug-absolute--top-right rug-mt-xs rug-mr-xs rug-cursor--pointer js--requires-cookie-consent-close"/><div class="rug-notification--info rug-p js-id--alert"><span class="rug-icon rug-icon--warn rug-icon--xl rug-mr-s" aria-hidden="true"/><p>We need your permission for setting certain cookies to be able to show this content.</p><p>You can <button class="rug-inline-button js--cookie-consent-popup">change your cookie settings</button>.</p></div></div></div>
{
"requiresCookieConsentCheck": "true",
"checkedCookieConsent": "no",
"hasCookieConsent": "no"
}
Wang, H., Pinna,
J., Romero, D. G., Di Mario, L., Koushki,
R. M., Kot, M., Portale, G. & Loi,
M. A., 9-mei-2024, In: Advanced materials.36, 19,
11 blz., 2311526.
Garcia-Orrit, S., Vega-Mayoral, V., Chen, Q., Serra, G., Guizzardi,
M., Romano, V., Dal Conte, S., Cerullo, G., Di
Mario, L., Kot, M., Loi, M. A., Narita, A., Müllen, K.,
Tommasini, M. & Cabanillas-González, J., 7-okt.-2024, In:
JOURNAL OF PHYSICAL CHEMISTRY LETTERS.15, 41,
blz. 10366-103749 blz.
Kot, M. & Lamhot, Y., 27-apr.-2023, Metrology, Inspection, and
Process Control XXXVII: Proceedings. Robinson, J. C. &
Sendelbach, M. J. (uitgave). 3A
uitgaveSociety of Photo-Optical Instrumentation
Engineers (SPIE), (Proceedings of the Society of
Photo-optical Instrumentation Engineers; vol. 12496).
