Electrical Measurements
![Fig. 1 Keithley 4200 - SCS Parameter Analyzer](/research/zernike/Nanostructures-of-functional-oxides/pics/Electrical_Keithley4200_259x152.jpg)
The electrical characterizations can be done using :
- Keithley 6517A Electrometer for measuring high resistance and small current measurements (100 aA resolution in 20 pA range).
- Keithley 4200-SCS Parameter Analyzer with 4 SMU (source measure unit), 1 PMU (ultra-fast pulse measure unit), 1 CVU (capacitance voltage unit: 1kHz-10MHz ) and Remote Preamplifier/Switch module.
![Fig. 2 Cypher ES - AFM](/research/zernike/Nanostructures-of-functional-oxides/pics/Electrical_Cypher-AFM_259x195.jpg)
- Keithley 6221 DC and AC current source (AC currents from 4 pA to 210 mA with sine waves up to 100 kHz).
- Keithley 236/237 Source Measure Units.
- Stanford Research Systems SR830 Lock-In Amplifiers.
- Stanford Research Systems SR560 low noise Pre-Amplifier.
- HP/Agilent 3458A, 3457A, 3478A DMM.
- Agilent E4980A LCR (20Hz to 2MHz)
- Agilent 4155B Semiconductor Parameter Analyzer
- Cypher ES - Atomic Force Microscope
Last modified: | 15 May 2024 3.33 p.m. |